Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)
by Harland G. Tompkins, James N. Hilfiker
A concise reference on spectroscopic ellipsometry techniques for practical thin film characterization and materials analysis.
About This Book
This book provides an introduction to spectroscopic ellipsometry and its use in thin film characterization.
It covers fundamental principles and practical techniques for materials analysis.
Readers will find guidance on applying ellipsometry methods to real-world measurement challenges.
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