Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
This third edition presents a focused reference on scanning electron microscopy and X-ray microanalysis. Written by a team of specialists, it brings together the scientific principles and technical subject matter surrounding these analytical methods for readers working or studying in microscopy, microanalysis, and related scientific fields.
About This Book
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition is a specialized scientific reference devoted to two important analytical techniques.
The book focuses on scanning electron microscopy and X-ray microanalysis, bringing these subjects together in a single volume.
It is suited to readers seeking technical background and practical understanding in microscopy, microanalysis, and related areas of science.
This edition is authored by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, and J.R. Michael.
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